Determination of Optimum Zn content in Cd1-xZnxS Nanoparticles
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چکیده
منابع مشابه
RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method
Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced films also have been investigated; th...
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ژورنال
عنوان ژورنال: Electronics Science Technology and Application
سال: 2018
ISSN: 2424-8460,2251-2608
DOI: 10.18686/esta.v5i1.63